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	1.	Trace analysis with nanomaterials / edited by David T. Pierce and Julia Xiaojun Zhao. by Pierce, David T Zhao, Julia Xiaojun Material type: Text; Format: print Publication details: Weinheim : Wiley-VCH, 2010 Availability: Items available for loan: UMK Kampus Jeli (1)Call number: QD139.T7 T73 2010 OS. Place hold
	2.	Methods for environmental trace analysis / John R. Dean. by Dean, John R Series: Analytical techniques in the sciences Material type: Text; Format: print Publication details: Chichester, West Sussex, England ; Hoboken, NJ : Wiley, c2003 Availability: Items available for loan: UMK Kampus Jeli (2)Call number: TD193 .D43 2003, ... Place hold
	3.	Advanced trace analysis / editor, Susanta Lahiri. by Lahiri, Susanta Material type: Text; Format: print Publication details: New Delhi : Narosa Pub. House, c2010 Availability: Items available for loan: UMK Kampus Jeli (2)Call number: QD139.T7 A35 2010, ... Place hold
	4.	Trace analysis / editor, Susanta Lahiri. by Lahiri, Susanta Material type: Text; Format: print ; Literary form: Not fiction Publication details: New Delhi : Narosa Publishing House, c2008 Availability: Items available for loan: UMK Kampus Jeli (1)Call number: QD139.T7 T683 2008. Place hold
	5.	Handbook of spectroscopy / edited by Günter Gauglitz and David S. Moore. by Gauglitz, G. (Günter) Moore, David S Edition: 2nd, enlarged edition. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Weinheim, Germany : Wiley-VCH Verlag, 2014 Availability: Items available for loan: UMK Kampus Jeli (4)Call number: QD95 .H36 2014, ... Items available for reference: UMK Kampus Jeli: Not for loan (4)Call number: QD95 .H36 2014, ... Place hold

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