Statistical analysis of geographic information with ArcView GIS and ArcGIS / David W.S. Wong, Jay Lee.

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Material type: Text

TextPublication details: Hoboken, N.J. : John Wiley & Sons, Inc., c2005.Edition: Fully rev. & updatedDescription: xvii, 441 p. : ill., maps ; 25 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Shelving location	Call number	Status	Date due	Barcode
Open Shelf	UMK Kampus Jeli	UMK Kampus Jeli	FSB	Kampus Jeli Open Shelf Level 1	G70.212 .L43 2005 (Browse shelf(Opens below))	Available		10084468

Rev. ed. of: Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong. 2001.

Includes bibliographical references and index.

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