Image from Google Jackets

Fit, failure, and the hall of fame : how companies succeed or fail / Raymond E. Miles, Charles C. Snow.

By: Contributor(s): Material type: TextTextPublication details: New York : Free Press ; Toronto : Maxwell Macmillan Canada ; New York : Maxwell Macmillan International, c1994.Description: iv, 215 p. : ill. ; 25 cmISBN:
  • 9780029212653
Subject(s):
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Kota UMK Kampus Kota FKP Kampus Kota Open Shelf HD31 .M436 1994 (Browse shelf(Opens below)) Available 10086685

Gift

Includes bibliographical references (p. 201-208) and index.

There are no comments on this title.

to post a comment.

©2025 Pustaka Universiti Malaysia Kelantan

THE OFFICE OF LIBRARY AND KNOWLEDGE MANAGEMENT