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Kelvin probe force microscopy : measuring and compensating electrostatic forces / Sascha Sadewasser, Thilo Glatzel, editors.

Contributor(s): Material type: TextTextSeries: Springer series in surface sciences ; 48.Publication details: Heidelberg ; New York : Springer-Verlag Berlin Heidelberg, c2012.Description: xiv, 331 p. : ill. (some col.) ; 24 cmISBN:
  • 9783642225659
Subject(s):
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli FIAT Kampus Jeli Open Shelf Level 1 QH212.A78 K45 2012 (Browse shelf(Opens below)) Available 10304539

Includes bibliographical references and index

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