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Spatial point patterns : methodology and applications with R / Adrian Baddeley, Ege Rubak, Rolf Turner.

By: Contributor(s): Material type: TextTextSeries: Champan & Hall/CRC Interdisciplinary Statistics SeriesPublication details: Boca Raton ; London ; New York : CRC Press : Taylor & Francis Group, c2016.Description: xvii, 810 p. : ill. ; c 27 cmISBN:
  • 9781482210200
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli FSB Kampus Jeli Open Shelf Level 1 QA402 .B35 2016 (Browse shelf(Opens below)) Available 10314149

Includes bibliographical references and indexes

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