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Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon.

Contributor(s): Material type: TextTextSeries: World Scientific series in materials and energyPublication details: Hackensack, NJ : World Scientific Publishing, 2012.Description: 2 v. : ill. (some col.) ; 24 cmISBN:
  • 9789814322805 (set)
  • 9789814322812 (v.1)
  • 9789814322829 (v.2)
Subject(s):
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli FBKT Kampus Jeli Open Shelf Level 1 TA418.9.N35 H35 2012 (Browse shelf(Opens below)) Available 10347799
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli FBKT Kampus Jeli Open Shelf Level 1 TA418.9.N35 H35 2012 (Browse shelf(Opens below)) Available 10347800

Includes bibliographical references and index

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