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Reputation management : the key to successful public relations and corporate communication / John Doorley and Helio Fred Garcia.

By: Contributor(s): Material type: TextTextPublisher: New York, NY : Routledge, 2021Copyright date: ©2021 Edition: Fourth editionDescription: xxxiv, 438 pages : illustration; 26 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9780815376958
Subject(s):
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Kota UMK Kampus Bachok FKP Kampus Bachok Open Shelf Level 1 HD59 .D66 2021 (Browse shelf(Opens below)) In transit from UMK Kampus Kota to UMK Kampus Bachok 10370473

Includes bibliographical references and index.

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