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Understanding faults : detecting, dating, and modeling / edited by David Tanner, Christian Brandes.

Contributor(s): Material type: TextTextPublication details: United States : Elsevier, c2020.Description: xiii, 366 p. : ill. (some col.) ; 23 cmISBN:
  • 9780128159859
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli FSB Kampus Jeli Open Shelf Level 1 QE606 .U53 2020 (Browse shelf(Opens below)) Available 10359922

Includes bibliographical references and index

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