Kelvin probe force microscopy :  measuring and compensating electrostatic forces / 
Sascha Sadewasser, Thilo Glatzel, editors. 
 - Heidelberg ;  New York :  Springer-Verlag Berlin Heidelberg,  c2012. 
 - xiv, 331 p. :  ill. (some col.) ;  24 cm. 
 - Springer series in surface sciences,  48.  0931-5195 ; .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783642225659 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy--Measurement.<br/>Electrostatics--Measurement.