Hosmer, David W. <br/><br/>
Applied logistic regression. 

 - Third edition /  David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant. 
 - Hoboken, New Jersey :  Wiley,  [2013] 
 - xvi, 500 pages :  illustrations ;  25 cm. 
 - Wiley series in probability and statistics. .
<br/><br/> "This Third Edition continues to focus on applications and interpretation of results from fitting regression models to categorical response variables"-- 
<br/><br/><label>ISBN: </label>9780470582473 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Regression analysis.<br/>MATHEMATICS / Probability & Statistics / Regression Analysis