TY  - BOOK
AU  - Schroder,Dieter K.
TI  - Semiconductor material and device characterization
SN  - 9780471739067
PY  - 2006///
CY  - [Piscataway, NJ], Hoboken, N.J.
PB  - IEEE Press, Wiley
KW  - Semiconductors
KW  - Testing
N1  - "Wiley-Interscience."; Fakulti  Agro Industri & Sumber Asli; Includes bibliographical references and index
ER  -