Failure-free integrated circuit packages :  systematic elimination of failures through reliability engineering, failure analysis, and material improvements / 
Charles Cohn, Charles A. Harper, [editors]. 
 - New York :  McGraw-Hill,  c2005. 
 - xix, 363 p. :  ill. ;  24 cm. 
 - McGraw-Hill professional engineering .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0071434844 9780071434843 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Fault tolerance.<br/>Microelectronic packaging.