Perry, Douglas L. <br/><br/>
Applied formal verification / 
Douglas L. Perry, Harry D. Foster. 
 - New York :  McGraw-Hill,  c2005. 
 - xiv, 237 p. :  ill. ;  24 cm. 
 - McGraw-Hill electronic engineering. .
 - McGraw-Hill electronic engineering series. .
<br/><br/>Includes bibliographical references (p. 227-229) and index 
<br/><br/><label>ISBN: </label>007144372X 9780071443722 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic circuits--Testing.<br/>Integrated circuits--Verification.