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Semiconductor material and device characterization / Dieter K. Schroder.

By: Material type: TextTextPublication details: [Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley, c2006.Edition: 3rd edDescription: xv, 779 p. : ill. ; 25 cmISBN:
  • 9780471739067
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
References References UMK Kampus Jeli UMK Kampus Jeli DEFAULT Kampus Jeli Reference Level 1 QC611 .S335 2006 REF (Browse shelf(Opens below)) Not for loan 10046109
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli DEFAULT Kampus Jeli Open Shelf Level 1 QC611 .S335 2006 OS (Browse shelf(Opens below)) Available 10046110
Open Shelf Open Shelf UMK Kampus Jeli UMK Kampus Jeli DEFAULT Kampus Jeli Open Shelf Level 1 QC611 .S335 2006 OS (Browse shelf(Opens below)) Available 10046111

"Wiley-Interscience."

Fakulti Agro Industri & Sumber Asli.

Includes bibliographical references and index.

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