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Artifact classification : a conceptual and methodological approach / Dwight W. Read.

By: Material type: TextTextPublisher: London ; New York : Routledge is an imprint of the Taylor & Francis Group, an Informa Business, 2016Copyright date: ©2007Description: 363 pages : illustrations ; 24 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9781598741032
Subject(s):
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok GENERAL Kampus Bachok Open Shelf Level 1 CC72.7 .R43 2016 (Browse shelf(Opens below)) Available 10366373
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok GENERAL Kampus Bachok Open Shelf Level 1 CC72.7 .R43 2016 (Browse shelf(Opens below)) Available 10366374
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok GENERAL Kampus Bachok Open Shelf Level 1 CC72.7 .R43 2016 (Browse shelf(Opens below)) Available 10366375
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok GENERAL Kampus Bachok Open Shelf Level 1 CC72.7 .R43 2016 (Browse shelf(Opens below)) Available 10366376
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok GENERAL Kampus Bachok Open Shelf Level 1 CC72.7 .R43 2016 (Browse shelf(Opens below)) Available 10366377

Includes bibliographical references (p. 324-346) and indexes

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