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Remote sensing and image interpretation / Thomas M. Lillesand, Ralph W. Kiefer, Jonathan W. Chipman.

By: Contributor(s): Material type: TextTextPublication details: New York : John Wiley & Sons, 2004.Edition: 5th edDescription: xiv, 763 p. : ill. (some col.), maps (some col.) ; 25 cmISBN:
  • 9780471152279
Subject(s):
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Holdings
Item type Current library Home library Collection Shelving location Call number Status Date due Barcode
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok FTKW Kampus Bachok Open Shelf Level 1 G70.4 .L55 2004 (Browse shelf(Opens below)) Available 10351502
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok FTKW Kampus Bachok Open Shelf Level 1 G70.4 .L55 2004 (Browse shelf(Opens below)) Available 10351503
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok FTKW Kampus Bachok Open Shelf Level 1 G70.4 .L55 2004 (Browse shelf(Opens below)) Available 10351504
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok FTKW Kampus Bachok Open Shelf Level 1 G70.4 .L55 2004 (Browse shelf(Opens below)) Available 10351505
Open Shelf Open Shelf UMK Kampus Bachok UMK Kampus Bachok FTKW Kampus Bachok Open Shelf Level 1 G70.4 .L55 2004 (Browse shelf(Opens below)) Available 10351506

Includes bibliographical references and index

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