Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon.
Material type:
TextSeries: World Scientific series in materials and energyPublication details: Hackensack, NJ : World Scientific Publishing, 2012.Description: 2 v. : ill. (some col.) ; 24 cmISBN: - 9789814322805 (set)
- 9789814322812 (v.1)
- 9789814322829 (v.2)
| Item type | Current library | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode | |
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UMK Kampus Jeli | UMK Kampus Jeli | FBKT | Kampus Jeli Open Shelf Level 1 | TA418.9.N35 H35 2012 (Browse shelf(Opens below)) | Available | 10347799 | ||
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Open Shelf
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UMK Kampus Jeli | UMK Kampus Jeli | FBKT | Kampus Jeli Open Shelf Level 1 | TA418.9.N35 H35 2012 (Browse shelf(Opens below)) | Available | 10347800 |
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Includes bibliographical references and index
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